{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T04:21:43Z","timestamp":1760242903382,"version":"build-2065373602"},"reference-count":24,"publisher":"MDPI AG","issue":"10","license":[{"start":{"date-parts":[[2016,10,18]],"date-time":"2016-10-18T00:00:00Z","timestamp":1476748800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/linproxy.fan.workers.dev:443\/https\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61201244"],"award-info":[{"award-number":["61201244"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shanghai funded training program of young teachers","award":["E1-8500-15-01046"],"award-info":[{"award-number":["E1-8500-15-01046"]}]},{"name":"the Doctoral Program Initiation Fund of SUES","award":["E1-0501-15-0209"],"award-info":[{"award-number":["E1-0501-15-0209"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Conventional correction approaches are unsuitable for effectively correcting remote sensing images acquired in the seriously oblique condition which has severe distortions and resolution disparity. Considering that the extraction of control points (CPs) and the parameter estimation of the correction model play important roles in correction accuracy, this paper introduces an effective correction method for large angle (LA) images. Firstly, a new CP extraction algorithm is proposed based on multi-view simulation (MVS) to ensure the effective matching of CP pairs between the reference image and the LA image. Then, a new piecewise correction algorithm is advanced with the optimized CPs, where a concept of distribution measurement (DM) is introduced to quantify the CPs distribution. The whole image is partitioned into contiguous subparts which are corrected by different correction formulae to guarantee the accuracy of each subpart. The extensive experimental results demonstrate that the proposed method significantly outperforms conventional approaches.<\/jats:p>","DOI":"10.3390\/s16101725","type":"journal-article","created":{"date-parts":[[2016,10,18]],"date-time":"2016-10-18T10:46:25Z","timestamp":1476787585000},"page":"1725","update-policy":"https:\/\/linproxy.fan.workers.dev:443\/https\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["An Effective Correction Method for Seriously Oblique Remote Sensing Images Based on Multi-View Simulation and a Piecewise Model"],"prefix":"10.3390","volume":"16","author":[{"given":"Chunyuan","family":"Wang","sequence":"first","affiliation":[{"name":"School of Electronicand Electrical Engineering, Shanghai University of Engineering Science, Longteng Road No. 333, Shanghai 201620, China"}]},{"given":"Xiang","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Electronicand Electrical Engineering, Shanghai University of Engineering Science, Longteng Road No. 333, Shanghai 201620, China"},{"name":"School of Computer Science, Shanghai Key Laboratory of Intelligent Information Processing, Fudan University, Shanghai 200433, China"}]},{"given":"Xiaoli","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Electronicand Electrical Engineering, Shanghai University of Engineering Science, Longteng Road No. 333, Shanghai 201620, China"}]},{"given":"Yongqi","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronicand Electrical Engineering, Shanghai University of Engineering Science, Longteng Road No. 333, Shanghai 201620, China"}]}],"member":"1968","published-online":{"date-parts":[[2016,10,18]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"2829","DOI":"10.1109\/TGRS.2010.2042813","article-title":"Fully Automatic Subpixel Image Registration of Multiangle CHRIS\/ProbaData","volume":"48","author":"Ma","year":"2010","journal-title":"IEEE Trans. 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