{"id":"https://openalex.org/W2887399373","doi":"https://doi.org/10.1109/smacd.2018.8434867","title":"A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation","display_name":"A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation","publication_year":2018,"publication_date":"2018-07-01","ids":{"openalex":"https://openalex.org/W2887399373","doi":"https://doi.org/10.1109/smacd.2018.8434867","mag":"2887399373"},"language":"en","primary_location":{"id":"doi:10.1109/smacd.2018.8434867","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2018.8434867","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056827862","display_name":"J. Diaz-Fortuny","orcid":"https://orcid.org/0000-0002-8186-071X"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"J. Diaz-Fortuny","raw_affiliation_strings":["Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB) Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB) Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035904954","display_name":"P. Saraz\u00e1-Canflanca","orcid":"https://orcid.org/0000-0003-2155-8305"},"institutions":[{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]},{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"P. Saraza-Canflanca","raw_affiliation_strings":["Instituto de Microelectr\u00f2nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f2nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076782353","display_name":"A. Toro-Fr\u00edas","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"A. Toro-Frias","raw_affiliation_strings":["Instituto de Microelectr\u00f2nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f2nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068422347","display_name":"R. Castro\u2010L\u00f3pez","orcid":"https://orcid.org/0000-0002-6247-3124"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"R. Castro-Lopez","raw_affiliation_strings":["Instituto de Microelectr\u00f2nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f2nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004487540","display_name":"J. Mart\u00edn-Mart\u00ednez","orcid":"https://orcid.org/0000-0001-5938-5898"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Martin-Martinez","raw_affiliation_strings":["Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB) Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB) Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011140420","display_name":"E. Roca","orcid":"https://orcid.org/0000-0001-6260-6495"},"institutions":[{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]},{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"E. Roca","raw_affiliation_strings":["Instituto de Microelectr\u00f2nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f2nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058670975","display_name":"R. Rodr\u0131\u0301guez","orcid":"https://orcid.org/0000-0002-4565-6703"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"R. Rodriguez","raw_affiliation_strings":["Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB) Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB) Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041853563","display_name":"F.V. Fern\u00e1ndez","orcid":"https://orcid.org/0000-0001-8682-2280"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"F.V. Fernandez","raw_affiliation_strings":["Instituto de Microelectr\u00f2nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f2nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017592638","display_name":"M. Nafr\u0131\u0301a","orcid":"https://orcid.org/0000-0002-9549-2890"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Nafria","raw_affiliation_strings":["Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB) Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB) Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5056827862"],"corresponding_institution_ids":["https://openalex.org/I123044942"],"apc_list":null,"apc_paid":null,"fwci":0.515,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.67438165,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"53","last_page":"56"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7161123752593994},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7083783149719238},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6222168207168579},{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.5569881796836853},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5541592240333557},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5338322520256042},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5092686414718628},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.4620482325553894},{"id":"https://openalex.org/keywords/circuit-extraction","display_name":"Circuit extraction","score":0.43052002787590027},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3875914216041565},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3810151219367981},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24737703800201416},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.22604697942733765},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19801205396652222},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.0771852433681488},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07224500179290771}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7161123752593994},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7083783149719238},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6222168207168579},{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.5569881796836853},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5541592240333557},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5338322520256042},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5092686414718628},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4620482325553894},{"id":"https://openalex.org/C26490066","wikidata":"https://www.wikidata.org/wiki/Q17006835","display_name":"Circuit extraction","level":4,"score":0.43052002787590027},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3875914216041565},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3810151219367981},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24737703800201416},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.22604697942733765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19801205396652222},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0771852433681488},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07224500179290771},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/smacd.2018.8434867","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2018.8434867","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.4699999988079071}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1965493119","https://openalex.org/W2001064859","https://openalex.org/W2042102270","https://openalex.org/W2065851146","https://openalex.org/W2118851676","https://openalex.org/W2147727474","https://openalex.org/W2734764095","https://openalex.org/W2735730703"],"related_works":["https://openalex.org/W2040773997","https://openalex.org/W2105900842","https://openalex.org/W2968041341","https://openalex.org/W2143645596","https://openalex.org/W3075611072","https://openalex.org/W2007317191","https://openalex.org/W1843927495","https://openalex.org/W1573688999","https://openalex.org/W2329294094","https://openalex.org/W3135874697"],"abstract_inverted_index":{"In":[0,34],"current":[1],"CMOS":[2],"advanced":[3],"technology":[4],"nodes,":[5],"accurate":[6],"extraction":[7,44],"of":[8,65],"transistor":[9],"parameters":[10,43],"affected":[11],"by":[12],"time-dependent":[13],"variability,":[14],"like":[15],"threshold":[16],"voltage":[17],"(Vth)":[18],"and":[19,30,40],"mobility":[20],"(\u03bc),":[21],"has":[22],"become":[23],"a":[24,37,50],"critical":[25],"issue":[26],"for":[27,69],"both":[28],"analog":[29],"digital":[31],"circuit":[32,71],"simulation.":[33,72],"this":[35],"work,":[36],"precise":[38],"VTH0":[39,57],"U0":[41],"BSIM":[42],"methodology":[45],"is":[46],"presented,":[47],"together":[48],"with":[49],"straightforward":[51],"I":[52],"<sub":[53],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[54],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DS</sub>":[55],"to":[56,60],"shift":[58],"conversion,":[59],"allow":[61],"the":[62],"complete":[63],"study":[64],"device":[66],"aging":[67],"effects":[68],"reliability":[70]},"counts_by_year":[{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}