{"id":"https://openalex.org/W2139860053","doi":"https://doi.org/10.1109/tcad.2005.852447","title":"Modular SOC testing with reduced wrapper count","display_name":"Modular SOC testing with reduced wrapper count","publication_year":2005,"publication_date":"2005-11-22","ids":{"openalex":"https://openalex.org/W2139860053","doi":"https://doi.org/10.1109/tcad.2005.852447","mag":"2139860053"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2005.852447","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2005.852447","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088556682","display_name":"Qiang Xu","orcid":"https://orcid.org/0000-0001-6747-126X"},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]},{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]},{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]},{"id":"https://openalex.org/I98251732","display_name":"McMaster University","ror":"https://ror.org/02fa3aq29","country_code":"CA","type":"education","lineage":["https://openalex.org/I98251732"]}],"countries":["CA","CN","HK"],"is_corresponding":true,"raw_author_name":"Qiang Xu","raw_affiliation_strings":["Computer Science and Engineering at the Chinese, University of Hong Kong, Hong Kong, China","Electrical and Computer Engineering, McMaster University, Hamilton, ONT, Canada","Telecommunication engineering, Beijing University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering at the Chinese, University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I177725633","https://openalex.org/I889458895"]},{"raw_affiliation_string":"Electrical and Computer Engineering, McMaster University, Hamilton, ONT, Canada","institution_ids":["https://openalex.org/I98251732"]},{"raw_affiliation_string":"Telecommunication engineering, Beijing University, Beijing, China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048457847","display_name":"Nicola Nicolici","orcid":"https://orcid.org/0000-0001-6345-5908"},"institutions":[{"id":"https://openalex.org/I3121153395","display_name":"West University of Timi\u015foara","ror":"https://ror.org/0583a0t97","country_code":"RO","type":"education","lineage":["https://openalex.org/I3121153395"]},{"id":"https://openalex.org/I43439940","display_name":"University of Southampton","ror":"https://ror.org/01ryk1543","country_code":"GB","type":"education","lineage":["https://openalex.org/I43439940"]},{"id":"https://openalex.org/I98251732","display_name":"McMaster University","ror":"https://ror.org/02fa3aq29","country_code":"CA","type":"education","lineage":["https://openalex.org/I98251732"]}],"countries":["CA","GB","RO"],"is_corresponding":false,"raw_author_name":"N. Nicolici","raw_affiliation_strings":["Computer Engineering, McMaster University, Hamilton, ONT, Canada","Degree in computer engineering, University of Timisoara, Timisoara, Romania","Electronics and Computer Science, University of Southampton, Southampton, UK"],"affiliations":[{"raw_affiliation_string":"Computer Engineering, McMaster University, Hamilton, ONT, Canada","institution_ids":["https://openalex.org/I98251732"]},{"raw_affiliation_string":"Degree in computer engineering, University of Timisoara, Timisoara, Romania","institution_ids":["https://openalex.org/I3121153395"]},{"raw_affiliation_string":"Electronics and Computer Science, University of Southampton, Southampton, UK","institution_ids":["https://openalex.org/I43439940"]}]}],"institutions":[],"countries_distinct_count":5,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5088556682"],"corresponding_institution_ids":["https://openalex.org/I139759216","https://openalex.org/I177725633","https://openalex.org/I889458895","https://openalex.org/I98251732"],"apc_list":null,"apc_paid":null,"fwci":1.8472,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.86343975,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"24","issue":"12","first_page":"1894","last_page":"1908"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.7150197625160217},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.6506621837615967},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6189565658569336},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5988112688064575},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.5781286358833313},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.569951057434082},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.508188009262085},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.49043819308280945},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.479595810174942},{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.4379645884037018},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.413273423910141},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3355120122432709},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.3176393508911133},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2477884590625763},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.22150078415870667},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1901998221874237}],"concepts":[{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.7150197625160217},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6506621837615967},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6189565658569336},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5988112688064575},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.5781286358833313},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.569951057434082},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.508188009262085},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.49043819308280945},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.479595810174942},{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.4379645884037018},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.413273423910141},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3355120122432709},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.3176393508911133},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2477884590625763},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.22150078415870667},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1901998221874237},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcad.2005.852447","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2005.852447","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.380.7496","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.380.7496","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cse.cuhk.edu.hk/~qxu/xu-tcad05.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1486331313","https://openalex.org/W1487867841","https://openalex.org/W1497461252","https://openalex.org/W1501987125","https://openalex.org/W1536055443","https://openalex.org/W1596724070","https://openalex.org/W1837496673","https://openalex.org/W1895504894","https://openalex.org/W1906764766","https://openalex.org/W1931458304","https://openalex.org/W2085806828","https://openalex.org/W2091813975","https://openalex.org/W2099089225","https://openalex.org/W2101924668","https://openalex.org/W2104548962","https://openalex.org/W2110129459","https://openalex.org/W2119285239","https://openalex.org/W2129244088","https://openalex.org/W2129390576","https://openalex.org/W2130111591","https://openalex.org/W2130430551","https://openalex.org/W2149132218","https://openalex.org/W2151243068","https://openalex.org/W2155288938","https://openalex.org/W2161708911","https://openalex.org/W2162086806","https://openalex.org/W2165642910","https://openalex.org/W2170533364","https://openalex.org/W4240788222","https://openalex.org/W4246913510","https://openalex.org/W4249696243","https://openalex.org/W4252472882"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2150046587","https://openalex.org/W2354946480","https://openalex.org/W2164349885","https://openalex.org/W4248272744","https://openalex.org/W2543176856","https://openalex.org/W2373135325","https://openalex.org/W1579528621","https://openalex.org/W4230966676","https://openalex.org/W2111803469"],"abstract_inverted_index":{"Motivated":[0],"by":[1,15],"the":[2,18,33,43,48,51,60,70,73,77,96,99,104,132,154,178,190,200],"increasing":[3],"design":[4,151],"for":[5,21,31,92,115,153,194],"test":[6,56,90,110,113,126,133,147,157,175],"(DFT)":[7],"area":[8,193],"overhead":[9],"and":[10,47,58,84,98,112,167,198],"potential":[11],"performance":[12],"degradation":[13],"caused":[14],"wrapping":[16],"all":[17],"embedded":[19],"cores":[20,53,64,78,83,107,117],"modular":[22,88,195],"system-on-a-chip":[23],"(SOC)":[24],"testing,":[25],"this":[26,141],"paper":[27],"proposes":[28],"a":[29,86,137,145],"solution":[30],"reducing":[32],"number":[34,179],"of":[35,50,62,72,106,180],"wrapper":[36],"boundary":[37],"register":[38],"(WBR)":[39],"cells.":[40],"By":[41],"utilizing":[42],"functional":[44],"interconnect":[45],"topology":[46],"WBRs":[49,61,80,105,181],"surrounding":[52],"to":[54,139],"transfer":[55,109],"stimuli":[57,111],"responses,":[59],"some":[63],"can":[65,182],"be":[66,183],"removed":[67],"without":[68,79],"affecting":[69],"testability":[71],"SOC.":[74],"We":[75,159],"denote":[76],"as":[81],"light-wrapped":[82,100,116],"present":[85,144],"new":[87],"SOC":[89,156,164,196],"architecture":[91],"concurrently":[93],"testing":[94,197],"both":[95],"wrapped":[97],"logic":[101],"cores.":[102,204],"Since":[103],"that":[108,128],"responses":[114],"become":[118],"shared":[119],"resources":[120],"during":[121,125],"test,":[122],"conflicts":[123],"arise":[124],"scheduling":[127],"will":[129,187],"negatively":[130],"impact":[131],"application":[134,176],"time.":[135],"As":[136],"consequence,":[138],"alleviate":[140],"problem,":[142],"we":[143],"novel":[146],"access":[148],"mechanism":[149],"(TAM)":[150],"algorithm":[152],"proposed":[155],"architecture.":[158],"conduct":[160],"experiments":[161],"on":[162],"several":[163],"benchmark":[165],"circuits":[166],"demonstrate":[168],"that,":[169],"with":[170],"an":[171],"acceptable":[172],"increase":[173],"in":[174],"time,":[177],"significantly":[184],"decreased.":[185],"This":[186],"ultimately":[188],"lessen":[189],"necessary":[191],"DFT":[192],"reduce":[199],"propagation":[201],"delays":[202],"between":[203]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}