Sheriff Sadiqbatcha
Jinwei Zhang
Sheriff Sadiqbatcha
Liang Chen 0025
Cuong Thi
Sachin Sachdeva
Hussam Amrouch
Sheldon X.-D. Tan
Hot-spot aware thermoelectric array based cooling for multicore processors.
73-82
2023
March
89
Integr.
https://doi.org/10.1016/j.vlsi.2022.11.006
db/journals/integration/integration89.html#ZhangSCTSAT23
Jinwei Zhang
Sheriff Sadiqbatcha
Sheldon X.-D. Tan
Hot-Trim: Thermal and Reliability Management for Commercial Multicore Processors Considering Workload Dependent Hot Spots.
2290-2302
2023
July
42
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
7
https://doi.org/10.1109/TCAD.2022.3216552
db/journals/tcad/tcad42.html#ZhangST23
Sheriff Sadiqbatcha
Jinwei Zhang
Hussam Amrouch
Sheldon X.-D. Tan
Real-Time Full-Chip Thermal Tracking: A Post-Silicon, Machine Learning Perspective.
1411-1424
2022
71
IEEE Trans. Computers
6
https://doi.org/10.1109/TC.2021.3086112
db/journals/tc/tc71.html#SadiqbatchaZAT22
Jinwei Zhang
Sheriff Sadiqbatcha
Michael O'Dea
Hussam Amrouch
Sheldon X.-D. Tan
Full-Chip Power Density and Thermal Map Characterization for Commercial Microprocessors Under Heat Sink Cooling.
1453-1466
2022
41
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
5
https://doi.org/10.1109/TCAD.2021.3088081
db/journals/tcad/tcad41.html#ZhangSOAT22
Liang Chen 0025
Sheriff Sadiqbatcha
Hussam Amrouch
Sheldon X.-D. Tan
Electrothermal Simulation and Optimal Design of Thermoelectric Cooler Using Analytical Approach.
3066-3077
2022
41
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
9
https://doi.org/10.1109/TCAD.2021.3120533
db/journals/tcad/tcad41.html#ChenSAT22
Sheriff Sadiqbatcha
Towards Addressing Thermal and Reliability Challenges in Nanometer Integrated Circuits
University of California, Riverside, USA
2021
https://www.escholarship.org/uc/item/3tp472dg
https://www.escholarship.org/content/qt3tp472dg/qt3tp472dg.pdf
Sheriff Sadiqbatcha
Jinwei Zhang
Hengyang Zhao
Hussam Amrouch
Jörg Henkel
Sheldon X.-D. Tan
Post-Silicon Heat-Source Identification and Machine-Learning-Based Thermal Modeling Using Infrared Thermal Imaging.
694-707
2021
40
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
4
https://doi.org/10.1109/TCAD.2020.3007541
db/journals/tcad/tcad40.html#SadiqbatchaZZAH21
Wentian Jin
Liang Chen 0025
Sheriff Sadiqbatcha
Shaoyi Peng
Sheldon X.-D. Tan
EMGraph: Fast Learning-Based Electromigration Analysis for Multi-Segment Interconnect Using Graph Convolution Networks.
919-924
2021
DAC
https://doi.org/10.1109/DAC18074.2021.9586239
conf/dac/2021
db/conf/dac/dac2021.html#JinCSPT21
Sheldon X.-D. Tan
Zeyu Sun 0001
Sheriff Sadiqbatcha
Interconnect Electromigration Modeling and Analysis for Nanometer ICs: From Physics to Full-Chip.
42-55
2020
13
IPSJ Trans. Syst. LSI Des. Methodol.
https://doi.org/10.2197/ipsjtsldm.13.42
db/journals/ipsj/ipsj13.html#TanSS20
Sheriff Sadiqbatcha
Zeyu Sun 0001
Sheldon X.-D. Tan
Accelerating Electromigration Aging: Fast Failure Detection for Nanometer ICs.
885-894
2020
39
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
4
https://doi.org/10.1109/TCAD.2019.2907908
db/journals/tcad/tcad39.html#SadiqbatchaST20
Sheriff Sadiqbatcha
Yue Zhao
Jinwei Zhang
Hussam Amrouch
Jörg Henkel
Sheldon X.-D. Tan
Machine Learning Based Online Full-Chip Heatmap Estimation.
229-234
2020
ASP-DAC
https://doi.org/10.1109/ASP-DAC47756.2020.9045204
conf/aspdac/2020
db/conf/aspdac/aspdac2020.html#SadiqbatchaZZAH20
Jinwei Zhang
Sheriff Sadiqbatcha
Wentian Jin
Sheldon X.-D. Tan
Accurate Power Density Map Estimation for Commercial Multi-Core Microprocessors.
1085-1090
2020
DATE
https://doi.org/10.23919/DATE48585.2020.9116545
conf/date/2020
db/conf/date/date2020.html#ZhangSJT20
Wentian Jin
Sheriff Sadiqbatcha
Jinwei Zhang
Sheldon X.-D. Tan
Full-Chip Thermal Map Estimation for Commercial Multi-Core CPUs with Generative Adversarial Learning.
14:1-14:9
2020
ICCAD
https://doi.org/10.1145/3400302.3415764
https://ieeexplore.ieee.org/document/9256729
https://www.wikidata.org/entity/Q131163554
conf/iccad/2020
db/conf/iccad/iccad2020.html#JinSZT20
Wentian Jin
Sheriff Sadiqbatcha
Zeyu Sun 0001
Han Zhou 0002
Sheldon X.-D. Tan
EM-GAN: Data-Driven Fast Stress Analysis for Multi-Segment Interconnects.
296-303
2020
ICCD
https://doi.org/10.1109/ICCD50377.2020.00057
conf/iccd/2020
db/conf/iccd/iccd2020.html#JinSSZT20
Jinwei Zhang
Sheriff Sadiqbatcha
Yuanqi Gao
Michael O'Dea
Nanpeng Yu
Sheldon X.-D. Tan
HAT-DRL: Hotspot-Aware Task Mapping for Lifetime Improvement of Multicore System using Deep Reinforcement Learning.
77-82
2020
MLCAD
https://doi.org/10.1145/3380446.3430623
conf/mlcad/2020
db/conf/mlcad/mlcad2020.html#ZhangSGOYT20
Wentian Jin
Sheriff Sadiqbatcha
Jinwei Zhang
Sheldon X.-D. Tan
EM-GAN: Fast Stress Analysis for Multi-Segment Interconnect Using Generative Adversarial Networks.
2020
abs/2004.13181
CoRR
https://arxiv.org/abs/2004.13181
db/journals/corr/corr2004.html#abs-2004-13181
Chase Cook
Sheriff Sadiqbatcha
Zeyu Sun 0001
Sheldon X.-D. Tan
Reliability based hardware Trojan design using physics-based electromigration models.
9-15
2019
66
Integr.
https://doi.org/10.1016/j.vlsi.2019.01.011
https://www.wikidata.org/entity/Q128462578
db/journals/integration/integration66.html#CookSST19
Han Zhou 0002
Zeyu Sun 0001
Sheriff Sadiqbatcha
Naehyuck Chang
Sheldon X.-D. Tan
EM-Aware and Lifetime-Constrained Optimization for Multisegment Power Grid Networks.
940-953
2019
27
IEEE Trans. Very Large Scale Integr. Syst.
4
https://doi.org/10.1109/TVLSI.2018.2889079
https://www.wikidata.org/entity/Q128595845
db/journals/tvlsi/tvlsi27.html#ZhouSSCT19
Zeyu Sun 0001
Sheriff Sadiqbatcha
Hengyang Zhao
Sheldon X.-D. Tan
Saturation-Volume Estimation for Multisegment Copper Interconnect Wires.
1666-1674
2019
27
IEEE Trans. Very Large Scale Integr. Syst.
7
https://doi.org/10.1109/TVLSI.2019.2901824
db/journals/tvlsi/tvlsi27.html#SunSZT19
Sheriff Sadiqbatcha
Hengyang Zhao
Hussam Amrouch
Jörg Henkel
Sheldon X.-D. Tan
Hot Spot Identification and System Parameterized Thermal Modeling for Multi-Core Processors Through Infrared Thermal Imaging.
48-53
2019
DATE
https://doi.org/10.23919/DATE.2019.8714918
conf/date/2019
db/conf/date/date2019.html#SadiqbatchaZAHT19
Sheriff Sadiqbatcha
Saeed Jafarzadeh
Yiannis Ampatzidis
Particle Swarm Optimization for Solving a Class of Type-1 and Type-2 Fuzzy Nonlinear Equations.
103-110
2018
8
J. Artif. Intell. Soft Comput. Res.
2
https://doi.org/10.1515/jaiscr-2018-0007
db/journals/jaiscr/jaiscr8.html#SadiqbatchaJA18
Zeyu Sun 0001
Sheriff Sadiqbatcha
Hengyang Zhao
Sheldon X.-D. Tan
Accelerating electromigration aging for fast failure detection for nanometer ICs.
623-630
2018
ASP-DAC
https://doi.org/10.1109/ASPDAC.2018.8297392
http://dl.acm.org/citation.cfm?id=3201752
conf/aspdac/2018
db/conf/aspdac/aspdac2018.html#SunSZT18
Chase Cook
Sheriff Sadiqbatcha
Zeyu Sun 0001
Sheldon X.-D. Tan
Reliability Based Hardware Trojan Design Using Physics-Based Electromigration Models.
5-8
2018
SMACD
https://doi.org/10.1109/SMACD.2018.8434890
conf/smacd/2018
db/conf/smacd/smacd2018.html#CookSST18
Sheriff Sadiqbatcha
Chase Cook
Zeyu Sun 0001
Sheldon X.-D. Tan
Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires.
21-24
2018
SMACD
https://doi.org/10.1109/SMACD.2018.8434891
conf/smacd/2018
db/conf/smacd/smacd2018.html#SadiqbatchaCST18
Sheriff Sadiqbatcha
Saeed Jafarzadeh
Yiannis Ampatzidis
Particle swarm optimization for solving a class of type-1 and type-2 fuzzy nonlinear equations.
1-5
2017
FUZZ-IEEE
https://doi.org/10.1109/FUZZ-IEEE.2017.8015474
conf/fuzzIEEE/2017
db/conf/fuzzIEEE/fuzzIEEE2017.html#SadiqbatchaJA17
Sheriff Sadiqbatcha
Saeed Jafarzadeh
An analytical approach for solving type-1 and type-2 fully fuzzy linear systems of equations.
453-460
2016
FUZZ-IEEE
https://doi.org/10.1109/FUZZ-IEEE.2016.7737722
conf/fuzzIEEE/2016
db/conf/fuzzIEEE/fuzzIEEE2016.html#SadiqbatchaJ16
Yiannis Ampatzidis
Hussam Amrouch
Naehyuck Chang
Liang Chen 0025
Chase Cook
Yuanqi Gao
Jörg Henkel
Saeed Jafarzadeh
Wentian Jin
Michael O'Dea
Shaoyi Peng
Sachin Sachdeva
Zeyu Sun 0001
Sheldon X.-D. Tan
Cuong Thi
Nanpeng Yu
Jinwei Zhang
Hengyang Zhao
Yue Zhao
Han Zhou 0002