<?xml version="1.0"?>
<dblpperson name="Karen Amirkhanyan" pid="64/5095" n="7">
<person key="homepages/64/5095" mdate="2019-11-12">
<author pid="64/5095">Karen Amirkhanyan</author>
<author pid="64/5095">K. Amirkhanyan</author>
</person>
<r><article key="journals/dt/MayahiniaTTAGHZ24" mdate="2024-11-30">
<author orcid="0000-0002-6084-9810" pid="272/2402">Mahta Mayahinia</author>
<author orcid="0000-0002-8829-5610" pid="55/3589">Mehdi Baradaran Tahoori</author>
<author pid="252/7289">Grigor Tshagharyan</author>
<author pid="64/5095">Karen Amirkhanyan</author>
<author orcid="0009-0006-2281-2087" pid="348/8482">Artur Ghukasyan</author>
<author orcid="0000-0002-9709-8336" pid="07/2799">Gurgen Harutyunyan</author>
<author pid="08/3972">Yervant Zorian</author>
<title>Testing for Electromigration in Sub-5-nm FinFET Memories.</title>
<pages>54-61</pages>
<year>2024</year>
<month>December</month>
<volume>41</volume>
<journal>IEEE Des. Test</journal>
<number>6</number>
<ee>https://doi.org/10.1109/MDAT.2024.3411527</ee>
<url>db/journals/dt/dt41.html#MayahiniaTTAGHZ24</url>
<stream>streams/journals/dt</stream>
</article>
</r>
<r><inproceedings key="conf/ewdts/AmirkhanyanBSVZ24" mdate="2025-03-05">
<author pid="64/5095">Karen Amirkhanyan</author>
<author pid="398/8881">A. Babayan</author>
<author pid="57/6999">Samvel K. Shoukourian</author>
<author pid="35/1669">Valery A. Vardanian</author>
<author pid="08/3972">Yervant Zorian</author>
<title>An Approach for Increasing Memory Repair Efficiency.</title>
<pages>1-6</pages>
<year>2024</year>
<booktitle>EWDTS</booktitle>
<ee>https://doi.org/10.1109/EWDTS63723.2024.10873706</ee>
<crossref>conf/ewdts/2024</crossref>
<url>db/conf/ewdts/ewdts2024.html#AmirkhanyanBSVZ24</url>
</inproceedings>
</r>
<r><inproceedings key="conf/ewdts/AmirkhanyanVSZ24" mdate="2025-03-05">
<author pid="64/5095">Karen Amirkhanyan</author>
<author pid="35/1669">Valery A. Vardanian</author>
<author pid="57/6999">Samvel K. Shoukourian</author>
<author pid="08/3972">Yervant Zorian</author>
<title>Repair of Resistive Open Defects on Word-Lines and Bit-Lines of SRAMs.</title>
<pages>1-6</pages>
<year>2024</year>
<booktitle>EWDTS</booktitle>
<ee>https://doi.org/10.1109/EWDTS63723.2024.10873635</ee>
<crossref>conf/ewdts/2024</crossref>
<url>db/conf/ewdts/ewdts2024.html#AmirkhanyanVSZ24</url>
</inproceedings>
</r>
<r><inproceedings key="conf/itc/MayahiniaTHTA22" mdate="2023-01-06">
<author pid="272/2402">Mahta Mayahinia</author>
<author pid="55/3589">Mehdi B. Tahoori</author>
<author pid="07/2799">Gurgen Harutyunyan</author>
<author pid="252/7289">Grigor Tshagharyan</author>
<author pid="64/5095">Karen Amirkhanyan</author>
<title>An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories.</title>
<pages>650-655</pages>
<year>2022</year>
<booktitle>ITC</booktitle>
<ee>https://doi.org/10.1109/ITC50671.2022.00091</ee>
<crossref>conf/itc/2022</crossref>
<url>db/conf/itc/itc2022.html#MayahiniaTHTA22</url>
</inproceedings>
</r>
<r><inproceedings key="conf/ewdts/AmirkhanyanV19" mdate="2019-11-12">
<author pid="64/5095">Karen Amirkhanyan</author>
<author pid="35/1669">Valery A. Vardanian</author>
<title>On a Method for Segmentation of Memory Instances with Row Redundancies.</title>
<pages>1-5</pages>
<year>2019</year>
<booktitle>EWDTS</booktitle>
<ee>https://doi.org/10.1109/EWDTS.2019.8884474</ee>
<crossref>conf/ewdts/2019</crossref>
<url>db/conf/ewdts/ewdts2019.html#AmirkhanyanV19</url>
</inproceedings>
</r>
<r><inproceedings key="conf/ewdts/AmirkhanyanDHMSVZ13" mdate="2023-03-23">
<author pid="64/5095">K. Amirkhanyan</author>
<author pid="135/0027">A. Davtyan</author>
<author pid="07/2799">Gurgen Harutyunyan</author>
<author pid="137/9258">T. Melkumyan</author>
<author pid="57/6999">Samvel K. Shoukourian</author>
<author pid="35/1669">Valery A. Vardanian</author>
<author pid="08/3972">Yervant Zorian</author>
<title>Application of defect injection flow for fault validation in memories.</title>
<pages>1-4</pages>
<year>2013</year>
<booktitle>EWDTS</booktitle>
<ee>https://doi.org/10.1109/EWDTS.2013.6673197</ee>
<ee>https://doi.ieeecomputersociety.org/10.1109/EWDTS.2013.6673197</ee>
<crossref>conf/ewdts/2013</crossref>
<url>db/conf/ewdts/ewdts2013.html#AmirkhanyanDHMSVZ13</url>
</inproceedings>
</r>
<r><inproceedings key="conf/iolts/ZorianVAA05" mdate="2023-03-23">
<author pid="08/3972">Yervant Zorian</author>
<author pid="35/1669">Valery A. Vardanian</author>
<author pid="53/4874">K. Aleksanyan</author>
<author pid="64/5095">K. Amirkhanyan</author>
<title>Impact of Soft Error Challenge on SoC Design.</title>
<pages>63-68</pages>
<year>2005</year>
<crossref>conf/iolts/2005</crossref>
<booktitle>IOLTS</booktitle>
<ee>https://doi.org/10.1109/IOLTS.2005.36</ee>
<ee>https://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.36</ee>
<url>db/conf/iolts/iolts2005.html#ZorianVAA05</url>
</inproceedings>
</r>
<coauthors n="12" nc="1">
<co c="0"><na f="a/Aleksanyan:K=" pid="53/4874">K. Aleksanyan</na></co>
<co c="0"><na f="b/Babayan:A=" pid="398/8881">A. Babayan</na></co>
<co c="0"><na f="d/Davtyan:A=" pid="135/0027">A. Davtyan</na></co>
<co c="0"><na f="g/Ghukasyan:Artur" pid="348/8482">Artur Ghukasyan</na></co>
<co c="0" n="2"><na f="h/Harutunyan:Gurgen" pid="07/2799">Gurgen Harutunyan</na><na>Gurgen Harutyunyan</na></co>
<co c="0"><na f="m/Mayahinia:Mahta" pid="272/2402">Mahta Mayahinia</na></co>
<co c="0"><na f="m/Melkumyan:T=" pid="137/9258">T. Melkumyan</na></co>
<co c="0"><na f="s/Shoukourian:Samvel_K=" pid="57/6999">Samvel K. Shoukourian</na></co>
<co c="0" n="2"><na f="t/Tahoori:Mehdi_Baradaran" pid="55/3589">Mehdi Baradaran Tahoori</na><na>Mehdi B. Tahoori</na></co>
<co c="0"><na f="t/Tshagharyan:Grigor" pid="252/7289">Grigor Tshagharyan</na></co>
<co c="0"><na f="v/Vardanian:Valery_A=" pid="35/1669">Valery A. Vardanian</na></co>
<co c="0"><na f="z/Zorian:Yervant" pid="08/3972">Yervant Zorian</na></co>
</coauthors>
</dblpperson>

