BibTeX record conf/afips/Yen69

download as .bib file

@inproceedings{DBLP:conf/afips/Yen69,
  author       = {Y. T. Yen},
  editor       = {Harrison W. Fuller},
  title        = {A method of automatic fault-detection test generation for four-phase
                  {MOS} {LSI} circuits},
  booktitle    = {American Federation of Information Processing Societies: {AFIPS} Conference
                  Proceedings: 1969 Spring Joint Computer Conference, Boston, MA, USA,
                  May 14-16, 1969},
  series       = {{AFIPS} Conference Proceedings},
  pages        = {215--220},
  publisher    = {{AFIPS} Press},
  year         = {1969},
  url          = {https://doi.org/10.1145/1476793.1476829},
  doi          = {10.1145/1476793.1476829},
  timestamp    = {Wed, 14 Apr 2021 16:50:07 +0200},
  biburl       = {https://dblp.org/rec/conf/afips/Yen69.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.