"Testable Design for Electrical Testing of Open Defects at Interconnects in ..."

Masaki Hashizume et al. (2013)

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DOI: 10.1109/ATS.2013.13

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Masaki Hashizume, Tomoaki Konishi, Hiroyuki Yotsuyanagi, Shyue-Kung Lu:
Testable Design for Electrical Testing of Open Defects at Interconnects in 3D ICs. Asian Test Symposium 2013: 13-18

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