"Revisiting Safe Operating Area: SiGe HBT Aging Models for ..."

Brian R. Wier et al. (2018)

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DOI: 10.1109/BCICTS.2018.8551087

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type: Conference or Workshop Paper

metadata version: 2021-10-14

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Brian R. Wier, Rafael Perez Martinez, Uppili S. Raghunathan, Hanbin Ying, Saeed Zeinolabedinzadeh, John D. Cressler:
Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design. BCICTS 2018: 215-218

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