Brian Crafton Zishen Wan Samuel Spetalnick Jong-Hyeok Yoon Wei Wu Carlos Tokunaga Vivek De Arijit Raychowdhury Improving compute in-memory ECC reliability with successive correction. 745-750 2022 DAC https://doi.org/10.1145/3489517.3530526 https://www.wikidata.org/entity/Q130976267 conf/dac/2022 db/conf/dac/dac2022.html#CraftonWSYWTDR22