BibTeX record conf/ets/CoyetteGVD14

• > Home > conf/ets/CoyetteGVD14

@inproceedings{DBLP:conf/ets/CoyetteGVD14,
  author       = {Anthony Coyette and
                  Georges G. E. Gielen and
                  Ronny Vanhooren and
                  Wim Dobbelaere},
  editor       = {Giorgio Di Natale},
  title        = {Optimization of analog fault coverage by exploiting defect-specific
                  masking},
  booktitle    = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
                  May 26-30, 2014},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ETS.2014.6847817},
  doi          = {10.1109/ETS.2014.6847817},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/CoyetteGVD14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}