"Efficient BIST TPG design and test set compaction for delay testing via ..."

Chih-Ang Chen, Sandeep K. Gupta (1998)

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DOI: 10.1109/ICCD.1998.727020

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-17

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Chih-Ang Chen, Sandeep K. Gupta:
Efficient BIST TPG design and test set compaction for delay testing via input reduction. ICCD 1998: 32-39

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