Nicholas Bowring John G. Baker John F. Alder Detection and Measurement of Thin Dielectric Layers Using Reflection of Frequency Scanned Millimetric Waves. 437-442 2007 ICNSC https://doi.org/10.1109/ICNSC.2007.372818 conf/icnsc/2007 db/conf/icnsc/icnsc2007.html#BowringBA07