"Pointwise local pattern exploration for sensitivity analysis."

Zhenyu Guo et al. (2011)

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DOI: 10.1109/VAST.2011.6102450

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Zhenyu Guo, Matthew O. Ward, Elke A. Rundensteiner, Carolina Ruiz:
Pointwise local pattern exploration for sensitivity analysis. IEEE VAST 2011: 131-140

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