H. G. Medeiros A. K. Brandl P. Kumar H. Scriba S. Vuillemin S. Race Ivana Kovacevic-Badstübner M. E. Bathen U. Grossner On How to Implement Experimentally Obtained Defect Characteristics in SiC Device Simulation. 1-6 2025 IRPS https://doi.org/10.1109/IRPS48204.2025.10983342 conf/irps/2025 db/conf/irps/irps2025.html#MedeirosBKSVRKB25