Multi-Level RTN with Certain Regularities in Oxide-RRAM: Experiments, Defect Dynamics and 3D Multi-Physics Modeling.

Dejiang Mu Pan Liu Zijian Zhou Zifei Cai Jian Zhang Kanhao Xue Zhigang Ji Xiangshui Miao Xingsheng Wang Multi-Level RTN with Certain Regularities in Oxide-RRAM: Experiments, Defect Dynamics and 3D Multi-Physics Modeling. 1-6 2025 IRPS https://doi.org/10.1109/IRPS48204.2025.10983298 conf/irps/2025 db/conf/irps/irps2025.html#MuLZCZXJMW25