Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs.

Wim Dobbelaere Frederik Colle Anthony Coyette Ronny Vanhooren Nektar Xama Jhon Gomez Georges G. E. Gielen Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. 1-4 2019 ITC https://doi.org/10.1109/ITC44170.2019.9000123 conf/itc/2019 db/conf/itc/itc2019.html#DobbelaereCCVXG19