HITS: High-coverage LLM-based Unit Test Generation via Method Slicing.

Zejun Wang Kaibo Liu Ge Li 0001 Zhi Jin 0001 HITS: High-coverage LLM-based Unit Test Generation via Method Slicing. 2024 abs/2408.11324 CoRR https://doi.org/10.48550/arXiv.2408.11324 db/journals/corr/corr2408.html#abs-2408-11324 streams/journals/corr