"Fault Leveling Techniques for Yield and Reliability Enhancement of NAND ..."

Shyue-Kung Lu, Shang-Xiu Zhong, Masaki Hashizume (2018)

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DOI: 10.1007/S10836-018-5752-7

access: closed

type: Journal Article

metadata version: 2020-09-11

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Shyue-Kung Lu, Shang-Xiu Zhong, Masaki Hashizume:
Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash Memories. J. Electron. Test. 34(5): 559-570 (2018)

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