<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<article key="journals/mj/ZhaoCGCJXCLW26" mdate="2026-02-01">
<author>Dongyan Zhao 0002</author>
<author orcid="0000-0001-9302-6696">Yining Chen 0001</author>
<author>Pang Guo</author>
<author orcid="0009-0009-7388-420X">Fangke Chen</author>
<author>Ruyue Jing</author>
<author>Xin Xu</author>
<author>Yanning Chen</author>
<author>Fang Liu</author>
<author>Bo Wu</author>
<title>A survey on semiconductor wafer yield prediction by artificial intelligence.</title>
<pages>106958</pages>
<year>2026</year>
<volume>167</volume>
<journal>Microelectron. J.</journal>
<ee>https://doi.org/10.1016/j.mejo.2025.106958</ee>
<url>db/journals/mj/mj167.html#ZhaoCGCJXCLW26</url>
<stream>streams/journals/mj</stream>
</article>
</dblp>
