"Degradation of static and dynamic behavior of CMOS inverters during ..."

Simone Gerardin et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.052

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type: Journal Article

metadata version: 2022-10-02

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Simone Gerardin, Alessio Griffoni, Andrea Cester, Alessandro Paccagnella, G. Ghidini:
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectron. Reliab. 46(9-11): 1669-1672 (2006)

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