<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<article key="journals/sensors/WangTLXSYWS22" mdate="2025-05-31">
<author orcid="0000-0003-0731-227X">Huachun Wang</author>
<author orcid="0000-0003-1396-0986">Jingjing Tian</author>
<author>Bingwei Lu</author>
<author>Yang Xie</author>
<author>Pengcheng Sun</author>
<author>Lan Yin</author>
<author>Yuguang Wang</author>
<author orcid="0000-0002-8744-1700">Xing Sheng</author>
<title>Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium.</title>
<pages>802</pages>
<year>2022</year>
<volume>22</volume>
<journal>Sensors</journal>
<number>3</number>
<ee type="oa">https://doi.org/10.3390/s22030802</ee>
<url>db/journals/sensors/sensors22.html#WangTLXSYWS22</url>
</article>
</dblp>
