"Pattern Classification With Corrupted Labeling via Robust Broad Learning ..."

Junwei Jin, Yanting Li, C. L. Philip Chen (2022)

> Home

Details and statistics

DOI: 10.1109/TKDE.2021.3049540

access: closed

type: Journal Article

metadata version: 2024-09-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tkde/JinLC22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tkde/JinLC22
Junwei Jin, Yanting Li, C. L. Philip Chen:
Pattern Classification With Corrupted Labeling via Robust Broad Learning System. IEEE Trans. Knowl. Data Eng. 34(10): 4959-4971 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.