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2020 – today
- 2025
[j21]Chunyu Peng, Junbo Chen, Mengyi Zhao, Wenjuan Lu, Zhiting Lin, Licai Hao, Xin Li, Chenghu Dai, Xiulong Wu:
8T-SRAM Computing-in-Memory Macro with Bitline Leakage Compensation. Circuits Syst. Signal Process. 44(7): 4607-4625 (2025)- [j20]Qiang Zhao
, Ziming Wang, Chunhui Fan, Bin Qiang, Jitao Xu, Xin Li, Zhigang Li, Licai Hao, Chunyu Peng, Zhiting Lin, Xiulong Wu:
A residual pulse broadening interpolation quantization column-level ADC architecture for CMOS image sensors. Microelectron. J. 159: 106638 (2025) - [j19]Shiyu Zhao, Qiang Zhao, Licai Hao, Hao Wang, Lang Tian, Chunyu Peng, Wenjuan Lu, Zhiting Lin, Xiulong Wu:
A double-modules interlocking triple-node upset-tolerant latch design. Microelectron. J. 159: 106647 (2025) - [j18]Chenghu Dai, Jianhao Zhang, Ruixuan Wang, Junbo Chen, Wei Hu, Licai Hao, Wenjuan Lu, Zhiting Lin, Chunyu Peng, Xiulong Wu:
A PVT-insensitive 7T SRAM CIM macro for multibit multiplication with dynamic matching quantization circuits. Microelectron. J. 161: 106703 (2025) - [j17]Qiang Zhao, Shiqi Dang, Zhendong Niu, Bin Qiang, Chunhui Fan, Zhigang Li, Licai Hao, Chunyu Peng, Zhiting Lin, Xiulong Wu:
An interval-adaptive correlated multiple sampling ADC with prejudgment logic for low-noise CMOS image sensors. Microelectron. J. 163: 106720 (2025) - [j16]Chunyu Peng, Neng Wan, Qiang Zhao, Chenghu Dai, Licai Hao, Zhiting Lin, Xiulong Wu:
A Low Overhead Single Event Transient Tolerant Bandgap Reference Based on Radiation-Hardened-By-Design (RHBD) Technique. IEEE Trans. Aerosp. Electron. Syst. 61(5): 13991-14000 (2025) - [j15]Licai Hao, Lang Tian, Hao Wang, Shiyu Zhao, Qiang Zhao, Chunyu Peng, Chenghu Dai, Zhi-Ting Lin, Xiulong Wu:
A Low-Cost and Triple-Node-Upset Self-Recoverable Latch Design With Low Soft Error Rate. IEEE Trans. Very Large Scale Integr. Syst. 33(4): 1108-1117 (2025) - [j14]Qiang Zhao, Qingyi Liu, Xinyi Zhang, Licai Hao, Xin Li, Shengyue Zhang, Chunyu Peng, Zhiting Lin, Xiulong Wu:
A High-Performance and High-Robustness Triple-Node-Upset Tolerant Latch Based on Redundant-Node Hardening. IEEE Trans. Very Large Scale Integr. Syst. 33(5): 1373-1383 (2025) - 2024
- [j13]Zhiting Lin, Changxin Yue, Ke Li, Qiushi Feng, Siyan Li, Yue Zhao, Yuanyang Wang, Jiaqi Chen, Wenjuan Lu, Chunyu Peng, Qiang Zhao, Chenghu Dai, Licai Hao, Xiulong Wu:
Cross-coupled 4T2R multi-logic in-memory computing circuit design. Microelectron. J. 147: 106179 (2024) - [j12]Shiyu Zhao, Qiang Zhao, Licai Hao, Chunyu Peng, Yaling Wang, Wenjuan Lu, Zhiting Lin, Xiulong Wu:
Design of polarity hardening SRAM for mitigating single event multiple node upsets. Microelectron. J. 149: 106214 (2024) - [j11]Qiang Zhao, Jitao Xu, Chunhui Fan, Ziming Wang, Ruitong Hu, Xin Li, Zhigang Li, Licai Hao, Chunyu Peng, Zhiting Lin, Xiulong Wu:
An 11-bit two-step column-shared ADC based on Flash/SS architecture for CMOS image sensor. Microelectron. J. 154: 106444 (2024) - [j10]Chunyu Peng, Lang Tian, Licai Hao, Qiang Zhao, Chenghu Dai, Zhiting Lin, Xiulong Wu:
High-Performance Latch Designs of Double-Node-Upset Self-Recovery and Triple-Node-Upset Tolerance for Aerospace Applications. IEEE Trans. Aerosp. Electron. Syst. 60(5): 6550-6561 (2024) - [j9]Yongliang Zhou, Zixuan Zhou, Yiming Wei, Zhen Yang, Xiao Lin, Chenghu Dai, Licai Hao, Chunyu Peng, Hao Cai, Xiulong Wu:
A CFMB STT-MRAM-Based Computing-in-Memory Proposal With Cascade Computing Unit for Edge AI Devices. IEEE Trans. Circuits Syst. I Regul. Pap. 71(1): 187-200 (2024) - [j8]Li Liu, Dele Tai, Bin Qiang, Lijun Guan, Chunyu Peng, Chenghu Dai, Licai Hao, Wenjuan Lu, Zhiting Lin, Qiang Zhao, Xiulong Wu:
Flip Point Offset-Compensation Sense Amplifier With Sensing-Margin-Enhancement for Dynamic Random-Access Memory. IEEE Trans. Circuits Syst. II Express Briefs 71(4): 1759-1763 (2024) - [j7]Licai Hao, Xinyi Zhang, Chenghu Dai, Qiang Zhao, Wenjuan Lu, Chunyu Peng, Yongliang Zhou, Zhiting Lin, Xiulong Wu:
Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch Based on Polarity Design and Source-Isolation Technologies. IEEE Trans. Very Large Scale Integr. Syst. 32(4): 597-608 (2024) - [j6]Licai Hao, Yaling Wang, Yunlong Liu, Shiyu Zhao, Xinyi Zhang, Yang Li, Wenjuan Lu, Chunyu Peng, Qiang Zhao, Yongliang Zhou, Chenghu Dai, Zhiting Lin, Xiulong Wu:
Low-Cost and Highly Robust Quadruple Node Upset Tolerant Latch Design. IEEE Trans. Very Large Scale Integr. Syst. 32(5): 883-896 (2024) - 2023
- [j5]Licai Hao, Bin Qiang, Chenghu Dai, Chunyu Peng, Wenjuan Lu, Zhiting Lin, Li Liu, Qiang Zhao, Xiulong Wu, Fei Sun:
Radiation-hardened 14T SRAM cell by polar design for space applications. IEICE Electron. Express 20(13): 20230083 (2023) - [j4]Licai Hao, Li Liu, Qi Shi, Bin Qiang, Zhengya Li, Nianlong Liu, Chenghu Dai, Qiang Zhao, Chunyu Peng, Wenjuan Lu, Zhiting Lin, Xiulong Wu:
Design of radiation-hardened memory cell by polar design for space applications. Microelectron. J. 132: 105691 (2023) - [j3]Chenghu Dai, Yuanyuan Du, Qi Shi, Ruixuan Wang, Hao Zheng, Wenjuan Lu, Chunyu Peng, Licai Hao, Zhiting Lin, Xiulong Wu:
Bit-line leakage current tracking and self-compensation circuit for SRAM reliability design. Microelectron. J. 132: 105699 (2023) - [j2]Pengfei Li, Xiuying Wang, Yin Zhang, Haoyu Wang, Jianjie Lu, Qiang Zhao, Licai Hao, Chunyu Peng, Wenjuan Lu, Zhiting Lin, Xiulong Wu:
Novel radiation-hardened-by-design (RHBD) 14T memory cell for aerospace applications in 65 nm CMOS technology. Microelectron. J. 141: 105954 (2023) - 2022
- [j1]Qiang Zhao, Hanwen Dong, Licai Hao, Xiuying Wang, Chunyu Peng, Xiulong Wu:
Novel radiation-hardened latch design for space-radiation environments. IEICE Electron. Express 19(13): 20220170 (2022)
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