"Latent graphical models for quantifying and predicting patent quality."

Yan Liu et al. (2011)

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DOI: 10.1145/2020408.2020586

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-16

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Yan Liu, Pei-yun Hseuh, Rick Lawrence, Steve Meliksetian, Claudia Perlich, Alejandro Veen:
Latent graphical models for quantifying and predicting patent quality. KDD 2011: 1145-1153

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