Genssler, Paul R.;Wasif, Sandy A.;Wael, Miran;Novkin, Rodion;Amrouch, Hussam
Frontiers in Edge AI with RISC-V: Quantized Neural Networks vs. Hyperdimensional Computing
Proceedings of the Conference on Design, Automation & Test in Europe (DATE'24)
2024

Kar, Anirban;Mema, Albi;Benkhelifa, Mahdi;Amrouch, Hussam
Beyond FinFETs: Transistor-to-GDS Benchmarking of AI Accelerators using Nanosheets and CFETs
IEEE International Symposium on VLSI Design, Automation and Test (VLSI-TSA'25)
2025

Benkhelifa, Mahdi;Amrouch, Hussam
SRAM Beyond FinFET: Performance and Aging Challenges in Nanosheet and CFET
IEEE Computer Society Annual Symposium on VLSI (ISVLSI'25)
2025

Amrouch, Hussam
Thermal Challenges beyond FinFET
IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED'25)
0025

Bishnoi, Rajendra;Diware, Sumit;Gebregiorgis, Anteneh;Thomann, Simon;Mannaa, Sara;Deveautour, Bastien;Marchand, Cedric;Bosio, Alberto;Deleruyelle, Damien;O’Connor, Ian;Amrouch, Hussam;Hamdioui, Said
Energy-efficient Computation-In-Memory Architecture using Emerging Technologies
Proceedings of the IEEE International Conference on Mechatronics (ICM'23)
2023

Jafarzadeh, Hanieh;Klemme, Florian;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Vmin Testing under Variations: Defect versus Fault Coverage
IEEE Latin American Test Symposium (LATS'24)
2024

Hien, Benjamin;Walter, Marcel;van Santen, Victor M.;Klemme, Florian;Parihar, Shivendra Singh;Pahwa, Girish;Chauhan, Yogesh S.;Amrouch, Hussam;Wille, Robert
Technology Mapping for Cryogenic CMOS Circuits
IEEE Computer Society Annual Symposium on VLSI (ISVLSI'24)
2024

Jafarzadeh, Hanieh;Klemme, Florian;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Time and Space Optimized Storage-based BIST under Multiple Voltages and Process Variations
IEEE European Test Symposium (ETS'24)
2024

Genssler, Paul;Mayahinia, Mahta;Thomann, Simon;Tahoori, Mehdi;Amrouch, Hussam
Technology/Algorithm Co-design for Reliable Energy-efficient NVM-based Hyperdimensional Computing under Voltage Scaling
Proceedings of the Conference on Design, Automation & Test in Europe (DATE'24)
2024

Jafarzadeh, Hanieh;Klemme, Florian;Dennis Reimer, Jan;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing
IEEE International Test Conference (ITC'24)
2024